X-ray Grazing Incidence Diffraction from Alkylsiloxane Monolayers on Silicon Wafers
Publication information:
I. M. Tidswell, T. A. Rabedeau, P. S. Pershan, S. D. Kosowsky, J.P. Folkers, and G. M. Whitesides. 1991. “X-Ray Grazing Incidence Diffraction from Alkylsiloxane Monolayers on Silicon Wafers”. J. Chem. Phys., 95, Pp. 2854-61
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